The intent of this project is to identify suitable x-ray Computed Tomography (CT) Image Quality Indicator (IQI) designs that can be used to adequately capture CT system performance. Customary IQI devices for 2D radiography are typically flat, and since the CT system implements geometric reconstruction using up to 360 degrees of incident angles, flat objects offer an unrealistic basis for a standard (unless the inspected part is of similar geometry). While some CT IQIs are commercially available (most geared for military or medical use), none are widely or universally accepted as standard. We aim to develop radially-symmetric IQIs, more consistent with NASA-related materials and inspection methods, that serve multiple purposes related to system performance evaluation.
These CT inspection tools will benefit all NASA centers with x-ray CT capabilities or x-ray CT inspection needs, as well as industry CT users. The benefit is the ability to use one common tool to assess system performance for a particular class of materials (such as plastics, aluminum, or titanium). The IQIs will be used to assess CT detectability limits, contrast sensitivity, and resolution. If additive manufacturing (AM) is utilized to generate the IQIs, a dual purpose, or secondary benefit to these IQIs is that the CT system may be used to ascertain AM material build defects and limitations.More »
|Organizations Performing Work||Role||Type||Location|
|Goddard Space Flight Center (GSFC)||Lead Organization||NASA Center||Greenbelt, MD|