The commercial application for NASA will require the successful follow on development of the concepts proposed in this submission. That development would result in a standalone metrology sub-system package that would be made available to upgrade the EBF3 systems at Langley Research Center for further evaluation on the systems currently in use on program development work. This in situ metrology package would have the ability to collect and process signals derived from the electron beam-component interaction that could offer spatially resolved dimensional information about the deposited material and the possibility of a second tier of control over the fabrication process wherein process parameters are adjusted to achieve target deposition dimensions. The functional deliverable package would consist of detector(s) to be place in the EBF3 chamber, a set of detection electronics, power supplies, hardware controls interface, cables and module and system level software necessary for integration to the EBF3. The Non-NASA commercial applications for this submission will also require the successful follow on development of the concepts proposed. That development would result in these and potential other metrology capabilities being fully designed and integrated into a ground up purpose built next generation Electron Beam Direct Wire Feed fabrication system. The results of the electron beam modeling and experimental work that will fold into an optics design specific to the AM task. These systems will be made available as a commercial turnkey product for a broad range of markets and applications. We envision these systems, as a result in part of this submission topic, to yield significantly improved and quantifiable results compared to those of the state of art today allowing them to begin more mainstream applications.