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SBIR/STTR

Monolithically integrated AlN/GaN electronics for harsh environments, Phase I

Completed Technology Project

Project Introduction

Monolithically integrated AlN/GaN electronics for harsh environments, Phase I
Recently, resonant-tunneling-diode (RTD) based circuits employing monolithically-integrated RTD on high electron mobility (HEMT) structures have been developed in a number of III-V systems in order to improve operational speed. The main goal of this program is to develop wide temperature-operable radiation hard monolithically-integrated electronics based on wide bandgap III-nitride epitaxial structures. More »

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This is a historic project that was completed before the creation of TechPort on October 1, 2012. Available data has been included. This record may contain less data than currently active projects.

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