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Center Innovation Fund: JPL CIF

100GB Rad Tolerant Solid State Drive (SSD), Year 1 (SSD)

Completed Technology Project
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Project Description

100GB Rad Tolerant Solid State Drive (SSD), Year 1
Conduct a heavy ion test campaign to characterize single event induced errors and adapt and evolve initial successful FY15 TID methodologies and algorithms. Multiple bit upset rates and possible single event upsets and functional interrupts need to characterized and factored into the overall error correction and mitigation scheme. Evaluate our methodologies/approach on 3D NAND based MLC devices. This is a fundamentally new way to produce NAND devices and is the basis for all future NAND development. Significantly reduces inter-cell parasitic effects – improve cell reliability and stability. Error codes are expected to evolve/requires new test HW development. Optimize scrubbing rate, SLC/MLC/Rank Modulation application and in-situ programming and coding channel structure. Determine relative contributions to maximize survivability and define SSD architecture. Fabricate 100mil enclosure and repeat in-situ TID test. Determine maximum possible operational dose for practical operation w/ stand alone FPGA control. More »

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Primary U.S. Work Locations and Key Partners

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